The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2014
Filed:
Dec. 15, 2012
The Boeing Company, Chicago, IL (US);
Ronald L. Bookout, Florissant, MO (US);
Michael P. Gleason, Edwardsville, IL (US);
Matthew M. Thomas, Maryland Heights, MO (US);
Michael S. Dixon, Brentwood, MO (US);
Robert Pless, Saint Louis, MO (US);
William D. Smart, Clayton, MO (US);
The Boeing Company, Chicago, IL (US);
Abstract
A method of detecting optical defects in a transparency may comprise the steps of providing a digital image of the transparency having a plurality of image pixels and detecting at least one candidate defect. The candidate defect may be detected by determining a grayscale intensity of each one of the image pixels and calculating an intensity gradient across adjacent pairs of the image pixels. Each image pixel may be assigned a gradient value comprising a maximum of the absolute value of the intensity gradients associated with the image pixel. A gradient image may be constructed comprising the gradient values assigned to corresponding ones of the image pixels. Image pixels may be identified as candidate pixels if such image pixels have a gradient value exceeding a gradient threshold. The candidate pixels may comprise the optical defect.