The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8644574 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 04, 2014

Filed:

Oct. 03, 2007
Applicants:

Raúl San José Estépar, Cambridge, MA (US);

George R. Washko, West Roxbury, MA (US);

Edwin K. Silverman, Brookline, MA (US);

John J. Reilly, Pittsburgh, PA (US);

Ron Kikinis, Chestnut Hill, MA (US);

Carl-fredrik Westin, Cambridge, MA (US);

Inventors:

Raúl San José Estépar, Cambridge, MA (US);

George R. Washko, West Roxbury, MA (US);

Edwin K. Silverman, Brookline, MA (US);

John J. Reilly, Pittsburgh, PA (US);

Ron Kikinis, Chestnut Hill, MA (US);

Carl-Fredrik Westin, Cambridge, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for reconstructing an image includes receiving tomographic data representative of an image signal; deriving, from the image signal, a plurality of components; identifying a spatial location associated with maximum phase congruency of the components; incorporating, into an image, an edge at the spatial location; and providing an output representative of the image.


Find Patent Forward Citations

Estépar, Raúl San José. (2014). Measurement of thin-layered structures in x-ray computer tomography (U.S. Patent No. 8644574). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8644574

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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