The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2014
Filed:
Jan. 15, 2010
Taihei Mukaide, Atsugi, JP;
Kazuhiro Takada, Kawasaki, JP;
Kazunori Fukuda, Fujisawa, JP;
Masatoshi Watanabe, Isehara, JP;
Taihei Mukaide, Atsugi, JP;
Kazuhiro Takada, Kawasaki, JP;
Kazunori Fukuda, Fujisawa, JP;
Masatoshi Watanabe, Isehara, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
Provided is an X-ray imaging apparatus and a method of X-ray imaging, with which the apparatus can be reduced in size and a with which differential phase image or a phase image with consideration of an X-ray absorption effect of an object can be obtained. A displacement of X-rays that have been split by a splitting element and have passed through an object is measured. The displacement can be measured by using a first attenuation element having a transmission amount that continuously changes in accordance with the incident position of X-rays. At this time, an X-ray transmittance of an object that is calculated by using a second attenuation element having a transmission amount that does not change in accordance with the incident position of X-rays is used.