The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2014
Filed:
Mar. 02, 2011
Taichirou Nezu, Musashino, JP;
Takayuki Kei, Musashino, JP;
Hideo Hirukawa, Musashino, JP;
Yohei Kuwabara, Musashino, JP;
Hironori Takai, Musashino, JP;
Taichirou Nezu, Musashino, JP;
Takayuki Kei, Musashino, JP;
Hideo Hirukawa, Musashino, JP;
Yohei Kuwabara, Musashino, JP;
Hironori Takai, Musashino, JP;
Yokogawa Electric Corporation, Musashino-shi, Tokyo, JP;
Abstract
There is provided a confocal microscope system configured so as to be compact in size without the needs for a large space, requiring fewer spots for adjustment. In the confocal microscope system, respective units making up the confocal microscope system are integrally housed in a protection cabinet covering the confocal microscope system, and when a specimen disposed opposite to an objective lens is moved toward an external face of the protection cabinet, a side of the external face, adjacent to an opening through which the specimen is taken in, or out, is defined as a front face, the Nipkow disk type scanner unit is disposed backward of the objective lens.