The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2014
Filed:
Dec. 06, 2011
LI Tao, Shanghai, CN;
Guiju Song, Shanghai, CN;
Xinjun Wan, Shanghai, CN;
Kevin George Harding, Niskayuna, NY (US);
Steven Robert Hayashi, Niskayuna, NY (US);
James Joseph Hoffman, Cincinnati, OH (US);
Charles Walter Muekmore, Clarksville, OH (US);
Yana Zhang Williams, Schenectady, NY (US);
Shukuan Xu, Shanghai, CN;
Li Tao, Shanghai, CN;
Guiju Song, Shanghai, CN;
Xinjun Wan, Shanghai, CN;
Kevin George Harding, Niskayuna, NY (US);
Steven Robert Hayashi, Niskayuna, NY (US);
James Joseph Hoffman, Cincinnati, OH (US);
Charles Walter Muekmore, Clarksville, OH (US);
Yana Zhang Williams, Schenectady, NY (US);
Shukuan Xu, Shanghai, CN;
General Electric Company, Schenectady, NY (US);
Abstract
A measurement system comprising a light source unit, a projection unit and an optics unit is disclosed. The light source unit is configured to generate a plurality of modulated phase shifted light beams. The projection unit is configured to reflect the modulated phase shifted light beams onto an object surface. The optics unit is configured to capture the modulated phase shifted light beams from the object surface. The measurement system further comprises a photodetector and a processor. The photodetector is configured to receive the modulated phase shifted light beams from the optics unit to generate electrical signals. The processor is configured to retrieve position information of the object surface based on the electrical signals from the photodetector. A measurement method is also presented.