The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2014
Filed:
Oct. 18, 2006
Matej Mlejnek, Vienna, AT;
Eduard Groller, Vienna, AT;
Anna Vilanova, Eindhoven, NL;
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
A method () of and a system () for probing a data of interest on the basis of an object comprised in a related image data, includes an instantiating step () for instantiating a probe, an applying step () for applying the probe to a location on a surface of the object, and a determining step () for determining a profile from the data of interest on the basis of the location of the probe. The probe is a virtual tool for extracting information from the data of interest. This tool is navigated on the basis of a view rendered from the related image data. The probe further determines the scope of probing. Thus, the method () and the system () enable the user to extract the desired information from the data of interest.