The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2014
Filed:
Dec. 22, 2012
Bertec Corporation, Columbus, OH (US);
Todd Christopher Wilson, Columbus, OH (US);
Necip Berme, Worthington, OH (US);
Bertec Corporation, Columbus, OH (US);
Abstract
A measurement and testing system includes a measurement assembly having at least one measurement device, at least one visual display device, and a data acquisition and processing device operatively coupled to the at least one measurement device of the measurement assembly and the visual display device. In one embodiment, the data acquisition and processing device is further configured to generate a timeline bar with date icons on the output screen of the visual display device. In other embodiments, the data acquisition and processing device is further configured to automatically displace a side bar menu on the output screen when a user switches from a current mode to another mode, read external files containing one or more testing routines written off-site, and/or automatically alert a system user when one or more signals from a measurement device are no longer detected and/or are corrupted.