The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2014

Filed:

Jul. 08, 2008
Applicants:

Mitsuhide Miyamoto, Kawasaki, JP;

Tohru Kohno, Kokubunji, JP;

Masato Ishii, Tokyo, JP;

Naruhiko Kasai, Yokohama, JP;

Hajime Akimoto, Kokubunji, JP;

Inventors:

Mitsuhide Miyamoto, Kawasaki, JP;

Tohru Kohno, Kokubunji, JP;

Masato Ishii, Tokyo, JP;

Naruhiko Kasai, Yokohama, JP;

Hajime Akimoto, Kokubunji, JP;

Assignees:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G 3/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

To determine a deterioration and maintain a high-quality image without unevenness of brightness by performing a precise correction, a detection scanning line for selecting a pixel which detects a deterioration of a pixel, a detection line for informing the outside of the display area of the property of a pixel selected for detecting the deterioration, a deterioration determination means for determining a deterioration amount based on a voltage corresponding to a current detected by the detection line, and a deterioration correction means (computation circuit) for reflecting the determination result of the deterioration determination means in image data supplied to the pixel, are provided.


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