The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2014

Filed:

Dec. 08, 2010
Applicants:

Jei-won Yeon, Daejeon, KR;

Kyuseok Song, Daejeon, KR;

Jaesik Hwang, Daejeon, KR;

Myung Hee Yun, Daejeon, KR;

Inventors:

Jei-Won Yeon, Daejeon, KR;

Kyuseok Song, Daejeon, KR;

Jaesik Hwang, Daejeon, KR;

Myung Hee Yun, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/02 (2006.01); G01R 27/08 (2006.01); G01N 27/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of detecting impurities in a high-temperature aqueous solution and an apparatus of detecting impurities for the same. Specifically, the present invention provides a method of detecting impurities in a high-temperature aqueous solution comprising a reducing agent using an electrochemical water chemistry technology detecting the electrochemical current varied according to the degree in which the impurities in the high-temperature aqueous solution hinder the formation of an oxide film that is formed on a noble metal electrode, and an impurity detecting apparatus comprising a noble metal electrode, a counter electrode, and a device of applying the electrochemical potential and measuring the electrochemical current for the method of detecting impurities.


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