The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2014
Filed:
Mar. 19, 2010
Nobuhiro Kitagawa, Akashi, JP;
Hiroyuki Tanaka, Halstenbek, DE;
Hiroo Tatsutani, Kobe, JP;
Tomoyuki Asahara, Kobe, JP;
Nobuhiro Kitagawa, Akashi, JP;
Hiroyuki Tanaka, Halstenbek, DE;
Hiroo Tatsutani, Kobe, JP;
Tomoyuki Asahara, Kobe, JP;
Sysmex Corporation, Hyogo, JP;
Abstract
The present invention is to present a sample testing apparatus comprising: a transport unit for transporting a sample container through a first position and a second position; a testing unit for performing a test on the sample in the sample container transported to the first position; a determination result obtainer for obtaining one of a first determination result indicating that a second test is required and a second determination result indicating that the second test is not required; and a transport controller for controlling the transport unit so as to transport the sample container back to the first position, if the first determination result has been obtained, wherein the sample container is not transported beyond the second position from the first position side before any one of the first and the second determination result has been obtained.