The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2014
Filed:
Aug. 24, 2010
Applicants:
Chin-sung Park, Yongin-si, KR;
Yoon-kyoung Cho, Suwon-si, KR;
Sook-young Kim, Yongin-si, KR;
Min-ae Jung, Gwangju-si, KR;
Jin-tae Kim, Hwaseong-si, KR;
Inventors:
Chin-sung Park, Yongin-si, KR;
Yoon-kyoung Cho, Suwon-si, KR;
Sook-young Kim, Yongin-si, KR;
Min-ae Jung, Gwangju-si, KR;
Jin-tae Kim, Hwaseong-si, KR;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01D 57/02 (2006.01); G01N 27/447 (2006.01);
U.S. Cl.
CPC ...
Abstract
A dielectrophoresis (DEP) apparatus including a concentration gradient generating unit, a method of separating a target material in a sample solution using the DEP apparatus, and a method of screening the optimum condition for separating a target material are provided.