The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2014

Filed:

Feb. 13, 2008
Applicants:

Jan Schroers, Hamden, CT (US);

Golden Kumar, New Haven, CT (US);

Hongxing Tang, Orange, CT (US);

Inventors:

Jan Schroers, Hamden, CT (US);

Golden Kumar, New Haven, CT (US);

Hongxing Tang, Orange, CT (US);

Assignee:

Yale University, New Haven, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B22D 21/00 (2006.01); B22D 19/16 (2006.01); C22C 45/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to materials, methods and apparatuses for performing imprint lithography using amorphous metallic materials. The amorphous metallic materials can be employed as imprint media and thermoplastic forming processes are applied during the pattern transfer procedure to produce micron scale and nanoscale patterns in the amorphous metallic layer. The pattern transfer is in the form of direct mask embossing or through a serial nano-indentation process. A rewriting process is also disclosed, which involves an erasing mechanism that is accomplished by means of a second thermoplastic forming process. The amorphous metallic materials may also be used directly as an embossing mold in imprint lithography to allow high volume imprint nano-manufacturing. This invention also comprises of a method of smoothening surfaces under the action of the surface tension alone.


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