The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2014
Filed:
Sep. 12, 2011
Applicant:
Cleopatra Cabuz, Eden Prairie, MN (US);
Inventor:
Cleopatra Cabuz, Eden Prairie, MN (US);
Assignee:
Honeywell International Inc., Morristown, NJ (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); G01N 29/265 (2006.01);
U.S. Cl.
CPC ...
G01N 29/265 (2013.01);
Abstract
A method of inspecting a structure comprises providing an inspection apparatus, engaging the inspection apparatus with an access system coupled to a structure, inspecting the access system using the inspection apparatus, and inspecting a portion of the structure using the inspection apparatus.
Cabuz, Cleopatra. (2014). System for the automated inspection of structures at height (U.S. Patent No. 8640558). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8640558
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile