The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2014
Filed:
Sep. 07, 2006
Nicolai Kosche, San Francisco, CA (US);
Oleg V. Mazurov, Palo Alto, CA (US);
Martin S. Itzkowitz, Redwood City, CA (US);
Nicolai Kosche, San Francisco, CA (US);
Oleg V. Mazurov, Palo Alto, CA (US);
Martin S. Itzkowitz, Redwood City, CA (US);
Oracle America, Inc., Redwood City, CA (US);
Abstract
A data space profiler may include an analysis engine that associates runtime events of profiled software applications with execution costs and extended address elements. Relational agents in the analysis engine may apply functions to profile data collected for each event to determine the extended address element values to be associated with the event. Each extended address element may correspond to a data profiling object (e.g., hardware component, software construct, data allocation construct, abstract view) involved in each event. The extended address element values may be used to index into an event set for the profiled software application to present costs from the perspective of these profiling objects. A filtering mechanism may also be used to extract profile data from the event set corresponding to events that satisfy the filter criteria. By alternating between presentation of profiling object views and filtered event data, performance bottlenecks and their causes may be identified.