The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2014
Filed:
Jul. 11, 2012
Masaaki Soda, Kanagawa, JP;
Masaaki Soda, Kanagawa, JP;
Renesas Electronics Corporation, Kawasaki-Shi, Kanagawa, JP;
Abstract
Provided is a noise analysis model and a noise analysis method that can analyze effects of substrate noise on each of elements included in a circuit to be analyzed. The noise analysis model includes first to third resistors. The first resistor serves as a substrate resistor in a semiconductor substrate between a first point set in the semiconductor substrate between a noise source and a transistor to which substrate noise from the noise source propagates through the semiconductor substrate and a second point set in the semiconductor substrate just below a back gate of the transistor. The second resistor serves as a substrate resistor in the semiconductor substrate between the second point and a fixed potential region near the transistor. The third resistor serves as a line resistor of a line connecting the fixed potential region and a power pad that supplies a ground potential.