The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2014
Filed:
Jun. 24, 2008
Tsuyoshi Ide, Kawasaki, JP;
Keisuke Inoue, Sagamihara, JP;
Toshiyuki Yamane, Yamato, JP;
Hironori Takeuchi, Yokohama, JP;
Tsuyoshi Ide, Kawasaki, JP;
Keisuke Inoue, Sagamihara, JP;
Toshiyuki Yamane, Yamato, JP;
Hironori Takeuchi, Yokohama, JP;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Properly detects an anomaly on the basis of directional data that are obtained in sequence from a monitored object. An anomaly detecting method includes: sequentially generating directional data indicating a feature of each piece of monitored data correspondingly to the monitored data which are input in sequence; calculating the dissimilarity of the directional data to a reference vector; updating a moment of the distribution of the dissimilarity appearing when the directional data is modeled with a multi-dimensional probability distribution, based on the moment already corresponding to the monitored data; calculating a parameter determining the variance of the multi-dimensional probability distribution, on the basis of the moment; calculating a threshold of the dissimilarity on the basis of the multi-dimensional probability distribution the variance of which is determined by the parameter; and detecting an anomaly in the monitored data that corresponds to the dissimilarity if the dissimilarity exceeds the threshold.