The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2014
Filed:
Mar. 07, 2012
Fan MO, Cuyahoga Heights, OH (US);
Sameep Dave, Cuyahoga Heights, OH (US);
Christian Rasmussen, Kgs. Lyngby, DK;
Mehmet Aydinlik, Maynard, MA (US);
Fan Mo, Cuyahoga Heights, OH (US);
Sameep Dave, Cuyahoga Heights, OH (US);
Christian Rasmussen, Kgs. Lyngby, DK;
Mehmet Aydinlik, Maynard, MA (US);
Acacia Communication Incorporated, Maynard, MA (US);
Abstract
Soft bit metric generation computational complexity can be reduced by identifying and utilizing only the dominant terms in a reliability calculation such as a logarithmic likelihood ratio (LLR). The dominant terms are those terms for which the signs of the x and y components match those of channel outputs of the channel outputs. One technique for identifying the dominant terms is by determining the most likely transitions from two consecutive channel output samples Values for the dominant terms can be estimated by either the joint reliability of two consecutive samples of the in-phase component (x,x) or by the joint reliability of two consecutive samples of the quadrature components (y,y).