The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2014
Filed:
May. 16, 2011
Christian Haufe, Dresden, DE;
Jens Pika, Bautzen, DE;
Jörg Winkler, Ullersdorf, DE;
Globalfoundries, Inc., Grand Cayman, KY;
Abstract
The soft error rate (SER) detector circuit presented here can be used to measure SER in combinatorial logic devices caused by radiation. The SER detector circuit includes a plurality of detector arrays coupled in series, and each having a plurality of SER test structures coupled in series. Each of the SER test structures includes a plurality of detector elements coupled in series. Each of the SER test structures is configured to detect single event transients (SETs) in a first operating mode and single event upsets (SEUs) in a second operating mode. The SER detector circuit also has control logic elements to control operation of the plurality of detector arrays.