The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2014
Filed:
Jun. 28, 2010
Aiyou Chen, New Providence, NJ (US);
Ming Xiong, Bridgewater, NJ (US);
Aiyou Chen, New Providence, NJ (US);
Ming Xiong, Bridgewater, NJ (US);
Alcatel Lucent, Paris, FR;
Abstract
In one aspect, a processing device of an information processing system is operative to perform high-dimensional stratified sampling of a database comprising a plurality of records arranged in overlapping sub-groups. For a given record, the processing device determines which of the sub-groups the given record is associated with, and for each of the sub-groups associated with the given record, checks if a sampling rate of the sub-group is less than a specified sampling rate. If the sampling rate of each of the sub-groups is less than the specified sampling rate, the processing device samples the given record, and otherwise does not sample the given record. The determine, check and sample operations are repeated for additional records, and samples resulting from the sample operations are processed to generate information characterizing the database. Other aspects of the invention relate to determining which records to sample through iterative optimization of an objective function that may be based, for example, on a likelihood function of the sampled records.