The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2014
Filed:
Dec. 31, 2008
Roman Leon Artiuch, Houston, TX (US);
Paul Stephen Hooks, Halstead, GB;
Roman Leon Artiuch, Houston, TX (US);
Paul Stephen Hooks, Halstead, GB;
Dresser, Inc., Addison, TX (US);
Abstract
Apparatus and associated systems and methods relate to automated learning of a baseline differential pressure (dP) characteristic to monitor the performance of a field-installed gas flow meter by comparing on-line dP measurements to the learned baseline dP characteristic. In an exemplary embodiment, a first baseline dP characteristic may be learned in a first mode over a first predetermined period of time according to a first set of learning criteria, and a second baseline dP characteristic may be learned in a second mode over a second predetermined period of time according to a second set of learning criteria. The first period of time may be substantially shorter than the second period of time. The first set of criteria may be substantially more relaxed than the second set of criteria. During the second mode, meter performance degradation may be diagnosed by comparing measured dP against the first baseline dP characteristic.