The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2014
Filed:
Apr. 04, 2013
Applicants:
Weilin Hou, Slidell, LA (US);
Alan D. Weidemann, Carriere, MS (US);
Inventors:
Weilin Hou, Slidell, LA (US);
Alan D. Weidemann, Carriere, MS (US);
Assignee:
The United States of America, as represented by the Secretary of the Navy, Washington, DC (US);
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for calculating an image quality metric for evaluating the quality of a digital image including the steps of denoising the data of the image, identifying edges in the denoised data, determining an edge profile of the edges, determining a grayscale angle for each identified edge in the edge profile that is associated with the edge, and calculating the image quality metric based on a weighted average of the grayscale angles for all the edges.