The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2014
Filed:
Mar. 29, 2010
Applicants:
Philipp Lang, Lexington, MA (US);
Daniel Steines, Lexington, MA (US);
Siau-way Liew, Pinole, CA (US);
Rene Vargas-voracek, Sunnyvale, CA (US);
Claude Arnaud, Mill Valley, CA (US);
Inventors:
Philipp Lang, Lexington, MA (US);
Daniel Steines, Lexington, MA (US);
Siau-Way Liew, Pinole, CA (US);
Rene Vargas-Voracek, Sunnyvale, CA (US);
Claude Arnaud, Mill Valley, CA (US);
Assignee:
ImaTx, Inc., Bedford, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
This disclosure relates to methods and devices for analyzing x-ray images. Furthermore, bone condition of a subject can be evaluated by analyzing x-ray images of the subject's bone from a sliding region of interest (ROI), e.g., an ROI that is moved on a pixel-by-pixel basis on the image, and therapies can then be selected or devised for the subject.