The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2014
Filed:
Aug. 28, 2009
Ram Naidu, Newton, MA (US);
Sergey Simanovsky, Brookline, MA (US);
Ram Naidu, Newton, MA (US);
Sergey Simanovsky, Brookline, MA (US);
Analogic Corporation, Peabody, MA (US);
Abstract
Techniques and/or systems for generating a two-dimensional projection image of an object under examination from helical data are provided herein. An image plane and a distance, or height, of an examination line lying in a plane parallel to the image plane may be selected with or without user input. Using the selected image plane and examination line, data may be extracted from one or more views indicative of the object. The data that is extracted from the respective views is generally indicative of rays that traverse the examination line and have a trajectory that meets predetermined criteria. Using the extracted data from a plurality of views, one or more projection lines that are substantially parallel to a corresponding image slice are produced and a two-dimensional projection image is generated.