The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2014
Filed:
Aug. 12, 2011
Applicants:
James F. Dempsey, Chagrin Falls, OH (US);
Roger Nana, Twinsburg, OH (US);
Tony Apicella, Mentor, OH (US);
Inventors:
James F. Dempsey, Chagrin Falls, OH (US);
Roger Nana, Twinsburg, OH (US);
Tony Apicella, Mentor, OH (US);
Assignee:
ViewRay Incorporated, Oakwood Village, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Systems and methods for correcting saturation banding artifacts in magnetic resonance imaging in which artifact and reference calibration scans are used to create one dimensional or two dimensional correction profiles, which are subsequently applied to actual diagnostic imaging scans to correct the saturation banding artifacts.