The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2014
Filed:
Apr. 24, 2012
Wenyi Zhao, Mountain View, CA (US);
Chenyu Wu, Mountain View, CA (US);
David Hirvonen, Brooklyn, NY (US);
Tao Zhao, Sunnyvale, CA (US);
Brian D. Hoffman, Sunnyvale, CA (US);
Simon Di Maio, Sunnyvale, CA (US);
Wenyi Zhao, Mountain View, CA (US);
Chenyu Wu, Mountain View, CA (US);
David Hirvonen, Brooklyn, NY (US);
Tao Zhao, Sunnyvale, CA (US);
Brian D. Hoffman, Sunnyvale, CA (US);
Simon Di Maio, Sunnyvale, CA (US);
Intuitive Surgical Operations, Inc., Sunnyvale, CA (US);
Abstract
Systems, methods, and devices are used to match images. Points of interest from a first image are identified for matching to a second image. In response to the identified points of interest, regions and features can be identified and used to match the points of interest to a corresponding second image or second series of images. Regions can be used to match the points of interest when regions of the first image are matched to the second image with high confidence scores, for example above a threshold. Features of the first image can be matched to the second image, and these matched features may be used to match the points of interest to the second image, for example when the confidence scores for the regions are below the threshold value. Constraint can be used to evaluate the matched points of interest, for example by excluding bad points.