The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2014
Filed:
Jan. 15, 2010
Taihei Mukaide, Atsugi, JP;
Kazuhiro Takada, Kawasaki, JP;
Kazunori Fukuda, Fujisawa, JP;
Masatoshi Watanabe, Isehara, JP;
Taihei Mukaide, Atsugi, JP;
Kazuhiro Takada, Kawasaki, JP;
Kazunori Fukuda, Fujisawa, JP;
Masatoshi Watanabe, Isehara, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
Provided is an X-ray imaging apparatus and a method of X-ray imaging, with which the apparatus can be reduced in size and a differential phase image or a phase image with consideration of an X-ray absorption effect of an object can be obtained. X-rays are spatially split, and a first attenuation element in which the transmission amount of X-rays continuously changes in accordance with the displacement when the X-rays pass through an object is used. Transmittance is calculated by using the first attenuation element and a second attenuation element that is different from the first attenuation element with respect to an amount of change or a characteristic of change in the transmission amount of X-rays in a direction of a displacement of the X-rays. A differential phase image and the like of the object are calculated using the transmittance.