The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2014
Filed:
Jun. 20, 2011
Yu-hsuan Lin, Tao-Yuan Hsien, TW;
Shih-yao Pan, Tao-Yuan Hsien, TW;
Hsin-yueh Sung, Tao-Yuan Hsien, TW;
Alvin Chang, Tao-Yuan Hsien, TW;
Hung-ta Chien, Tao-Yuan Hsien, TW;
Yu-Hsuan Lin, Tao-Yuan Hsien, TW;
Shih-Yao Pan, Tao-Yuan Hsien, TW;
Hsin-Yueh Sung, Tao-Yuan Hsien, TW;
Alvin Chang, Tao-Yuan Hsien, TW;
Hung-Ta Chien, Tao-Yuan Hsien, TW;
Chroma Ate Inc., Tao-Yuan, Hsien, TW;
Abstract
An imaging apparatus includes a light source; a first beam splitter for reflecting a projection beam emitted by the light source; an objective lens unit including a reflection reference surface for reproducing the projection beam into a measurement beam projected onto an object to generate a first reflection beam and a reference beam projected onto the reflection reference surface to generate a second reflection beam mixing with the first reflection beam and passing through the first splitter and forming an operating beam; a second beam splitter for modulating the operating beam into first and second sub-beams; a monochrome image detection device for passage of the first sub-beam to obtain an interferometric image with monochrome from a first interference region; and an image detection device for permitting passage of the second sub-beam in order to obtain a non-interferometric image from a second interference region.