The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2014
Filed:
May. 24, 2011
Applicants:
Frank M. Haran, North Vancouver, CA;
Stéphane Savard, Vancouver, CA;
Inventors:
Frank M. Haran, North Vancouver, CA;
Stéphane Savard, Vancouver, CA;
Assignee:
Honeywell International Inc., Morristown, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/45 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for compensating for errors in a spectrometer is provided that includes measuring at least a portion of a path length for a signal traveling through the spectrometer during a measurement scan of a material. A detector signal corresponding to the measurement scan is generated. Compensation for errors in the detector signal is provided based on the measurement of the path length.
Haran, Frank. (2014). Error compensation in a spectrometer (U.S. Patent No. 8638443). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8638443
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile