The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2014

Filed:

Jun. 29, 2011
Applicants:

Wun-ki Jung, Suwon-si, KR;

Seog Heon Ham, Suwon-si, KR;

Dong Hun Lee, Yongin-si, KR;

Kwi Sung Yoo, Seoul, KR;

Min Ho Kwon, Seoul, KR;

Inventors:

Wun-Ki Jung, Suwon-si, KR;

Seog Heon Ham, Suwon-si, KR;

Dong Hun Lee, Yongin-si, KR;

Kwi Sung Yoo, Seoul, KR;

Min Ho Kwon, Seoul, KR;

Assignee:

Samsung Electronics Co., Ltd., Suwon-Si, Gyeonggi-Do, KR;

Attorney:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 3/14 (2006.01); H04N 5/335 (2011.01);
U.S. Cl.
CPC ...
Abstract

A correlated double sampling circuit includes a delta-sigma modulator, a selection circuit, and an accumulation circuit. The delta-sigma modulator is configured to receive an input signal, delta-sigma modulate the input signal, and output a modulation signal. The selection circuit is configured to invert the modulation signal and selectively output one of the modulation signal and an inverted modulation signal in response to a selection signal corresponding to an operation phase. The accumulation circuit is configured to generate a first accumulation result by performing an accumulation process on one of the modulation signal and the inverted modulation signal in a first operation phase, and generate a second accumulation result by performing the accumulation process on the first accumulation result and the other one of the modulation signal and the inverted modulation signal in a second operation phase.


Find Patent Forward Citations

Loading…