The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2014
Filed:
May. 04, 2012
Russell Patrick Bobbitt, Pleasantville, NY (US);
Quanfu Fan, Somerville, MA (US);
Arun Hampapur, Norwalk, CT (US);
Frederik Kjeldsen, Poughkeepsie, NY (US);
Sharathchandra Umapathirao Pankanti, Darien, CT (US);
Akira Yanagawa, New York, NY (US);
Yun Zhai, White Plains, NY (US);
Russell Patrick Bobbitt, Pleasantville, NY (US);
Quanfu Fan, Somerville, MA (US);
Arun Hampapur, Norwalk, CT (US);
Frederik Kjeldsen, Poughkeepsie, NY (US);
Sharathchandra Umapathirao Pankanti, Darien, CT (US);
Akira Yanagawa, New York, NY (US);
Yun Zhai, White Plains, NY (US);
Toshiba Global Commerce, Tokyo, JP;
Solutions Holdings Corporation, Tokyo, JP;
Abstract
Techniques for detecting one or more events are provided. The techniques include using multiple overlapping regions of interest on a video sequence to cover a location for one or more events, wherein each event is associated with at least one of the multiple overlapping regions of interest, applying multiple-instance learning to the video sequence to select one or more of the multiple overlapping regions of interest to construct one or more location-aware event models, and applying the models to the video sequence to detect the one or more events and to determine the one or more regions of interest that are associated with the one or more events.