The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2014
Filed:
Nov. 01, 2011
Takashi Hibino, Narita, JP;
Takashi Fujimoto, Narita, JP;
Shigeki Namekata, Narita, JP;
Keisuke Komatsu, Narita, JP;
Yoshiyuki Nakao, Osaka, JP;
Makoto Takata, Osaka, JP;
Makoto Sakamoto, Osaka, JP;
Takashi Hibino, Narita, JP;
Takashi Fujimoto, Narita, JP;
Shigeki Namekata, Narita, JP;
Keisuke Komatsu, Narita, JP;
Yoshiyuki Nakao, Osaka, JP;
Makoto Takata, Osaka, JP;
Makoto Sakamoto, Osaka, JP;
Nippon Steel & Sumitomo Metal Corporation, Tokyo, JP;
Abstract
A rotary eddy current flaw detection probe device has a plurality of Θ-shaped eddy current flaw detection probes attached in a rotating disc for detecting flaws in all directions regardless of the flaw direction. Four Θ-shaped eddy current testing probes Pto Pare arranged around the rotation center Dsof a rotating discand are embedded in the disc. The coil planes of detector coils Dsto Dsof the testing probes Pto Pare parallel with each other, and are perpendicular to the rotation plane of the rotating disc. The coil planes of the detector coils incline at an angle θ relative to a line Y passing through the centers Psand Psof the probes Pand P. The detector coils Dcand Dcare cumulatively connected to each other and the detector coils Dcand Dcare differentially connected to each other.