The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2014

Filed:

May. 24, 2012
Applicants:

Keita Watanabe, Kanagawa, JP;

Takeshi Kuwabara, Kanagawa, JP;

Yasufumi Oda, Kanagawa, JP;

Jun Enomoto, Kanagawa, JP;

Takeshi Koishi, Kanagawa, JP;

Inventors:

Keita Watanabe, Kanagawa, JP;

Takeshi Kuwabara, Kanagawa, JP;

Yasufumi Oda, Kanagawa, JP;

Jun Enomoto, Kanagawa, JP;

Takeshi Koishi, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A flat panel detector has an imaging area, in which pixels are arrayed in a matrix and signal lines for reading out electric signals from the pixels are provided, to detect an image of a subject from x-rays which are incident on the imaging area after penetrating the subject. Detective elements are arranged in the imaging area, to output electric signals corresponding to incident x-rays. Based on previously stored sensitivity data on the detective elements, high-sensitivity elements are selected from among the detective elements. The start of radiation and the end of radiation of x-rays toward the imaging area are detected by monitoring the electric signals from the selected high-sensitivity elements, to control operation of the imaging device on the basis of the detected start and end of radiation.


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