The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2014
Filed:
Oct. 05, 2011
Applicants:
Zhenhong Sun, Shanghai, CN;
Tao Pan, Shanghai, CN;
Wendy Wang, Shanghai, CN;
Hang Liao, Shanghai, CN;
Inventors:
Zhenhong Sun, Shanghai, CN;
Tao Pan, Shanghai, CN;
Wendy Wang, Shanghai, CN;
Hang Liao, Shanghai, CN;
Assignee:
Honeywell International Inc., Morristown, NJ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12M 1/34 (2006.01); C12M 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and apparatus for real-time, simultaneous, qualitative measurement of one or more single nucleotide polymorphisms in one or more target nucleic acids is provided. This method involves combining a polymerase chain reaction (PCR) technique with an evanescent wave technique.