The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2014

Filed:

Jun. 14, 2010
Applicants:

Daniel R. Elgort, New York, NY (US);

Lucian Remus Albu, Forest Hills, NY (US);

Inventors:

Daniel R. Elgort, New York, NY (US);

Lucian Remus Albu, Forest Hills, NY (US);

Assignee:

Koninklijke Philips N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/055 (2006.01);
U.S. Cl.
CPC ...
Abstract

A magnetic resonance examination system comprises an RF-system for inducing resonance in polarized dipoles and receiving magnetic resonance signals from an object to be examined. A thermometry module dervies a temperature distribution of the object to be examined from the magnetic resonance signals. The magnetic resonance examination system further comprises a photonic-based hyperpolarization device with a photonic source for emitting electromagnetic radiation, a moder converter, such as a phase hologram to impart orbital angular momentum to the electromagnetic radiation and via spatial filter to select from the phase hologram a diffracted photonic beam endowed with orbital angular momentum for polarizing the dipoles via transferred orbital angular momentum.


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