The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2014
Filed:
Mar. 26, 2008
Tetsuya Shoji, Susono, JP;
Akira Kato, Mishima, JP;
Toshiji Mukai, Tsukuba, JP;
Hidetoshi Somekawa, Tsukuba, JP;
Tetsuya Shoji, Susono, JP;
Akira Kato, Mishima, JP;
Toshiji Mukai, Tsukuba, JP;
Hidetoshi Somekawa, Tsukuba, JP;
Toyota Jidosha Kabushiki Kaisha, Toyota-shi, Aichi, JP;
National Institute for Materials Science, Tsukuba-shi, Ibaraki, JP;
Abstract
An Mg alloy provided with high strength and high ductility by matching the strength and ductility in tensile deformation and compressive deformation at the same levels is provided. The Mg alloy of the present invention is characterized by having a chemical composition consisting of Y: 0.1 to 1.5 at % and a balance of Mg and unavoidable impurities and having a microstructure with high Y regions with Y concentrations higher than an average Y concentration distributed at nanometer order sizes and intervals. The present invention further provides an Mg alloy characterized by having a chemical composition consisting of Y: more than 0.1 at % and a valance of Mg and unavoidable impurities, having a microstructure with high Y regions with Y concentrations higher than an average Y concentration distributed at nanometer order sizes and intervals and having an average recrystallized grain size within the range satisfying the following formula 1:−0.87+1.10<log<1.14+1.48,  formula 1:where c: Y content (at %) andd: average recrystallized grain size (μm).