The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2014

Filed:

Apr. 23, 2009
Applicants:

Katsunori Kawano, Kanagawa, JP;

Yoshio Nishihara, Kanagawa, JP;

Yasuaki Kuwata, Kanagawa, JP;

Inventors:

Katsunori Kawano, Kanagawa, JP;

Yoshio Nishihara, Kanagawa, JP;

Yasuaki Kuwata, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/02 (2006.01); G01P 3/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is a measuring apparatus that includes: a semiconductor laser device that emits a laser light beam to an object to be measured; a driving unit that provides a driving signal for modulation drive of the semiconductor laser device; a first detection unit that detects a first electrical signal that corresponds to the intensity of the laser light beam modulated due to the self-coupling effect, in a first half-cycle of the driving signal; a second detection unit that detects a second electrical signal that corresponds to the intensity of a second laser light beam modulated due to the self-coupling effect, in a second half-cycle of the driving signal being in an opposite phase of the first half-cycle; a calculation unit that calculates a difference between the first and second electrical signals; and a measuring unit that measures a change in the state of the object based on the calculated difference.


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