The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2014

Filed:

Sep. 13, 2012
Applicants:

Junpei Maruyama, Yamanashi, JP;

Minoru Kobayashi, Yamanashi, JP;

Inventors:

Junpei Maruyama, Yamanashi, JP;

Minoru Kobayashi, Yamanashi, JP;

Assignee:

Fanuc Corporation, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 45/77 (2006.01);
U.S. Cl.
CPC ...
Abstract

A movable unit in an injection molding machine is started to operate and the current physical quantity and the current time (or current position of the movable unit) are detected. The current physical quantity is stored as a reference physical quantity in association with the elapsed time of operation of the movable unit (or position of the movable unit). A deviation of the current physical quantity from the reference physical quantity is calculated and stored, a distribution index value is then calculated from the physical quantity deviations in the first to n-th cycles, and a threshold value is determined from the distribution index value. When the deviation exceeds the threshold value, alarm processing is performed.


Find Patent Forward Citations

Maruyama, Junpei. (2014). Abnormality detector for an injection molding machine (U.S. Patent No. 8636495). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8636495

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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