The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2014
Filed:
Jul. 19, 2011
Laurence Warden, Poway, CA (US);
Andreas W. Dreher, Escondido, CA (US);
John Ferro, Santa Rosa, CA (US);
Jagdish M. Jethmalani, San Diego, CA (US);
Shui T. Lai, Encinitas, CA (US);
Laurence Warden, Poway, CA (US);
Andreas W. Dreher, Escondido, CA (US);
John Ferro, Santa Rosa, CA (US);
Jagdish M. Jethmalani, San Diego, CA (US);
Shui T. Lai, Encinitas, CA (US);
Essilor International (Compagnie General d'Optique), Charenton Cedex, FR;
Abstract
A method of customizing vision correction including measuring optical aberration data of a patient's eye and calculating a lens definition based on the optical aberration data, wherein calculating the lens definition comprises calculating a correction of at least one low order aberration and at least one high order aberration and is based at least partly on the patient's pupil size.