The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2014
Filed:
Oct. 22, 2010
Rong Zeng Cao, Beijing, CN;
Wei Ding, Beijing, CN;
Xiang Yang He, Beijing, CN;
Shun Jiang, Beijing, CN;
Juhnyoung Lee, Yorktown Heights, NY (US);
Feng LI, Beijing, CN;
Tie Liu, Beijing, CN;
Chun Hua Tian, Beijing, CN;
Feng Chun Wang, Beijing, CN;
Hao Zhang, Beijing, CN;
Rong Zeng Cao, Beijing, CN;
Wei Ding, Beijing, CN;
Xiang Yang He, Beijing, CN;
Shun Jiang, Beijing, CN;
Juhnyoung Lee, Yorktown Heights, NY (US);
Feng Li, Beijing, CN;
Tie Liu, Beijing, CN;
Chun Hua Tian, Beijing, CN;
Feng Chun Wang, Beijing, CN;
Hao Zhang, Beijing, CN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Irregular food manufacturing detection by using conversion pattern in one aspect generates one or more rules associated with amount of resources used to manufacture a food product, collects data associated with a selected manufacturing process of the food product at a selected manufacturer and determines whether the collected data complies with the generated one or more rules. Irregularity may be identified if the collected data does not comply with the generated one or more rules.