The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2014

Filed:

Mar. 15, 2011
Applicants:

Len DE Oto, Springfield, OH (US);

Richard Policy, Urbana, OH (US);

Stan Hodge, Hilliard, OH (US);

Inventors:

Len De Oto, Springfield, OH (US);

Richard Policy, Urbana, OH (US);

Stan Hodge, Hilliard, OH (US);

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05B 33/08 (2006.01); G01R 31/36 (2006.01); G06F 17/40 (2006.01); G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
Abstract

Methods and systems for monitoring operation of an LED string. An exemplary system includes an LED string, a circuit that supplies current to the LEDs, a current measuring circuit that measures current through the LEDs, a voltage measuring circuit that measures voltage across the LEDs, and a temperature sensor that measures temperature proximate to the LEDs. A processor calculates a predicted string voltage based on a predefined voltage-current curve, number of LEDs, a predefined temperature coefficient value, the measured string current, a measured junction temperature, a life curve function, a prestored calibration string current value, a prestored calibration string voltage value, a prestored junction calibration temperature and an accumulated time value. The process also calculates an error value based on the predicted string voltage and a measured string voltage and generates an indication that there is a failure in the LED string if the calculated error value is greater than the predefined error limit.


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