The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2014

Filed:

Sep. 14, 2012
Applicants:

Christopher C Kiley, Carlisle, MA (US);

Peter Van Der Meulen, Newburyport, MA (US);

Forrest T Buzan, Dunstable, MA (US);

Paul E. Fogel, Somerville, MA (US);

Inventors:

Christopher C Kiley, Carlisle, MA (US);

Peter van der Meulen, Newburyport, MA (US);

Forrest T Buzan, Dunstable, MA (US);

Paul E. Fogel, Somerville, MA (US);

Assignee:

Brooks Automation, Inc., Chelmsford, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device is provided having a robotic arm for handling a wafer, the robotic arm including one or more encoders that provide encoder data identifying a position of one or more components of the robotic arm. The device also having a processor adapted to apply an extended Kalman Filter to the encoder data to estimate a position of the wafer.


Find Patent Forward Citations

Kiley, Christopher. (2014). Wafer center finding with kalman filter (U.S. Patent No. 8634633). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8634633

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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