The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2014
Filed:
May. 12, 2011
Chiuming Lueng, Hong Kong, CN;
Mankit Lee, Hong Kong, CN;
Wanyin Kwan, Hong Kong, CN;
Cheukwing Leung, Hong Kong, CN;
Juren Ding, Hong Kong, CN;
Rongkwang NI, Hong Kong, CN;
Chiuming Lueng, Hong Kong, CN;
Mankit Lee, Hong Kong, CN;
Wanyin Kwan, Hong Kong, CN;
Cheukwing Leung, Hong Kong, CN;
Juren Ding, Hong Kong, CN;
Rongkwang Ni, Hong Kong, CN;
SAE Magnetics (H.K.) Ltd., Hong Kong, CN;
Abstract
A close loop method for measuring head SNR, for a storage device comprising a storage media and a head, comprising steps of: (a) loading the head on the media with a dynamic fly height; (b) measuring an initial environmental temperature value T1 and measuring the head signal signal; (c) unloading the head; (d) adjusting a power which controls the dynamic fly height until a real-time environmental temperature value T2 is equal to the initial environmental temperature T1; (e) measuring the head noise value noise, (f) calculating the head SNR with the follow equation: The method of the present invention can obtain a fair condition between the signal and noise measurement, thereby a reliable and accurate head SNR can be obtain. The present invention also provides a close loop method for measuring media SNR.