The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2014
Filed:
Dec. 28, 2009
Torsten Kludas, Zottelstedt, DE;
Nick Mein, Christchurch, NZ;
Brendon Swann, Christchurch, NZ;
Trimble Jena GmbH, Jena, DE;
Abstract
A feature detection apparatus and method for obtaining in a defined area of interest a parametric shape based on a selected combination of parameter values, constituting an approximation to an object feature. The feature detection apparatus includes an input unit for receiving at least two area indicator lines for defining in a digital image an area of interest, a parameter range defining unit for defining ranges of at least two parameters of a parametric shape, for which the parametric shape intersects at least one of the area indicator lines; a parameter selection unit for selecting a combination of parameter values from the parameter ranges, for which the parametric shape constitutes an approximation to an object feature of the object in the area of interest; and an output unit for providing the parametric shape based on said combination of parameter values for a display in the digital image.