The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2014

Filed:

Jun. 07, 2010
Applicants:

Yonatan Wexler, Redmond, WA (US);

Eyal Ofek, Redmond, WA (US);

Blaise Hilary Aguera Y Arcas, Seattle, WA (US);

Inventors:

Yonatan Wexler, Redmond, WA (US);

Eyal Ofek, Redmond, WA (US);

Blaise Hilary Aguera y Arcas, Seattle, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Images provide rich information regarding what they depict. For example, an image may have additional information, such as depth and/or 3D location values, for some points within the image. It may be advantageous to extrapolate the values from the valued points to the entire image because a new view of the image may be generated based upon values of points. Accordingly, an interpolated image may be generated by interpolating values for unvalued points based upon values of valued points. In particular, a set of valued points having desired cost paths may be determined for an unvalued point. A model may be applied to the set of valued points to interpolate a value for the unvalued point. One or more interpolated images may be projected onto a new view. In particular, points within an interpolated image may be projected onto locations within the new view based upon values of the points.


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