The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2014

Filed:

Mar. 16, 2011
Applicants:

Markus Weiger Senften, Zurich, CH;

Thomas Oberhammer, Wolhusen, CH;

Franciszek Hennel, Karlsruhe, DE;

Inventors:

Markus Weiger Senften, Zurich, CH;

Thomas Oberhammer, Wolhusen, CH;

Franciszek Hennel, Karlsruhe, DE;

Assignee:

Bruker BioSpin MRI GmbH, Ettlingen, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/48 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for designing the time dependence function k(t) for a given k-space trajectory k, where m stands for one or multiple of the spatial dimension indices x, y, or z, of a magnetic resonance imaging (=MRI) experiment carried out on an MRI system, wherein the trajectory kis generated by applying a time varying waveform g(t) of a gradient magnetic field, the method taking into account—the gradient magnitude limit G and—the gradient slew rate limit S of the MRI system, is characterized in that the method further takes into account a given frequency limit F in such a way that the gradient waveform g(t) does not contain frequency components above the frequency limit F which is characteristic for the gradient hardware of the MRI system. The invention provides a method for designing a time dependence function for a given k-space trajectory, which allows obtaining better quality MRI images.


Find Patent Forward Citations

Loading…