The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2014
Filed:
Feb. 02, 2011
Shoji Yokoi, Nagoya, JP;
Takayuki Sakurai, Kakamigahara, JP;
Tatsuya Okayama, Wako, JP;
Masanobu Miki, Wako, JP;
Keizo Iwama, Wako, JP;
Makoto Hattori, Wako, JP;
Hidetaka Ozawa, Wako, JP;
Shoji Yokoi, Nagoya, JP;
Takayuki Sakurai, Kakamigahara, JP;
Tatsuya Okayama, Wako, JP;
Masanobu Miki, Wako, JP;
Keizo Iwama, Wako, JP;
Makoto Hattori, Wako, JP;
Hidetaka Ozawa, Wako, JP;
NGK Insulators, Ltd., Nagoya, JP;
Honda Motor Co., Ltd., Minato-Ku, JP;
Abstract
The apparatus is provided with an abnormality determination means for determining abnormality of the apparatus where two different combinations of two electrodes are selected from the three electrodes, an alternating-current voltage is applied to an electrode in one combination by the voltage-applying portion to measure a value of a current flowing to the other electrode via the dielectric body by electrostatic coupling, an alternating-current voltage is applied to an electrode in another combination out of the at least two different combinations by the voltage-applying portion to measure a value of a current flowing to the other electrode via the dielectric body by electrostatic coupling, and an abnormality of the apparatus is determined from the current values measured.