The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2014
Filed:
Apr. 06, 2011
Pietro Marella, Rome, IT;
Pietro Marella, Rome, IT;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Automatically creating a progression plan for a software test, by computing for each test period unit x the effort for attempting to perform test units, ATTx, and the effort for completing test unit execution, CCx. Three variables characterizing the test strategy are introduced in the computation: the Effectiveness, which represents the efficiency of the test team, the Defect Density rate, and the Verify rate value. By choosing the test strategy, the test manager defines the three variables' values which influence the progression plan. During test execution, a cumulative 'attempted' curve of the ATTx values and a cumulative 'complete' curve of the CCx values allow the test manager to compare the effort already made to the effort expected to be made for the Test Units which have been attempted and for the Test Units which have been completed, i.e. when the defects found in the code have been corrected.