The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8631053 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 14, 2014

Filed:

Aug. 31, 2009
Applicants:

Wei Sun, Waterloo, CA;

Shantanu D. Rane, Cambridge, MA (US);

Anthony Vetro, Arlington, MA (US);

Inventors:

Wei Sun, Waterloo, CA;

Shantanu D. Rane, Cambridge, MA (US);

Anthony Vetro, Arlington, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments disclose a method and a system for determining securely the Manhattan distance between a first and a second signal. The system is mapping the first signal to a first binary signal; mapping the second signal to a second binary signal, such that the squared distance between the first signal and the second binary signals equals the Manhattan distance; reducing respectively dimensions of the first binary signal and the second binary signal to produce a first low dimensional signal and a second low dimensional signal, such that the squared distance between the first low dimensional signal and the second low dimensional signals approximates the squared distance between the first binary signal and the second binary signals; and determining securely the squared distance between the first low dimensional signal and the second low dimensional signals to securely determine the Manhattan distance between the first signal and the second signal.


Find Patent Forward Citations

Sun, Wei. (2014). Method for securely determining manhattan distances (U.S. Patent No. 8631053). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8631053

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