The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2014

Filed:

May. 28, 2010
Applicants:

Vivek R. Narasayya, Redmond, WA (US);

Ravishankar Ramamurthy, Redmond, WA (US);

Hicham G. Elmongui, Alexandria, EG;

Inventors:

Vivek R. Narasayya, Redmond, WA (US);

Ravishankar Ramamurthy, Redmond, WA (US);

Hicham G. Elmongui, Alexandria, EG;

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Described is a test framework for testing transformation rules of query optimizers. Rule patterns obtained as tree structures from a query optimizer are used to generate queries that are used to test the rule optimizer's transformation rules. The test framework tracks which rules are exercised for each query, and also determines the correctness of the transformation rule by comparing the results of the query processing with the rule and without the rule (by turning off the rule). The test framework creates a composite pattern corresponding to two or more rules, such as to test rules in a set (e.g., as pairs). Also described is the efficient execution of a test suite for correctness testing, in which queries of the test suite are selected based upon cost information.


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