The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2014
Filed:
Nov. 25, 2009
Pierre Biver, Pau, FR;
Denis Allard, Avignon, FR;
Dimitri D'or, Sombreffe, BE;
Other;
Abstract
A method of estimating lithologic properties of a geological zone represented by a grid, in which method facies are allocated to the nodes of the grid by sequential stochastic simulation. For a target node (x) from a set of target nodes for scanning iteratively, and for each possible facies (c), a conditional probability (p) of observing said facies is estimated knowing that respective facies have already been allocated to other nodes in the neighborhood. A random draw weighted by these conditional probabilities is then performed. The estimation of the conditional probabilities makes use of univariate probabilities (p) and of bivariate probabilities (p) of observing two facies at two respective nodes of the grid. Each bivariate probability used in estimating the conditional probability relates to the target node (x) and to a node (x) neighboring the target node.